专利名称：Method for measuring the adhesion of a
coating on a substrate
发明人：CHATELLIER, JEAN-YVES FRANCOIS
ROGER,RAMAHEFASOLO, DANIEL SEBASTIEN
申请号：EP01400530.0申请日：20010301公开号：EP1130391A1公开日：20010905
专利附图：
摘要：Ultrasound is applied to the substrate (2) and covering (3). A succession ofreflected echoes is detected and an attenuation coefficient, from the echo amplitude
decrease as a function of the number of reflections, is determined. An adherence value isdeduced from a correlation function estimated previously from calibration tests betweenattenuation coefficients and adherence of coverings obtained from mechanical tests oncalibrated test samples. The correlation function is produced by fabricating several lotsof standard test samples. The test samples of each lot being identical. The covering isripped from the substrate by traction whilst measuring the tearing resistance. Thetearing resistance for the correlation function is taken as the best in each lot. Theattenuation coefficient is an exponential function which multiplies a distance traveled bythe ultrasound in the sample under test. A single sensor (6) transmits and receives theultrasound perpendicular to the substrate and covering. The covering is on a face of thesubstrate farthest away from the sensor.
申请人：SNECMA MOTEURS
地址：2, Boulevard du Général Martial Valin 75015 Paris FR
国籍：FR
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